Climatic Chamber Configurator
Discover the Climatic Chamber Configurator
Our guide to choosing the climate chamber best suited to your needs.

Every laboratory test must ensure the reproduction of standard conditions to obtain consistent and reliable results.
Testing fixtures are those tools that guarantee the stability of the tested sample and, as we will see, this is a very broad category of objects.
Even talking about objects is reductive when compared to testing fixtures.
The concept of testing fixtures is very common in computer science where it describes a particular type of software and/or a set of procedures designed to test a computer system under well-defined startup conditions.
In product and material testing, a testing fixture is a physical object that physically holds the test sample in place within the test area.
Even among mechanical testing fixtures there are notable differences depending on the construction and purpose of the fixture itself.
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A large part of the test fixtures consists of mechanical testing fixtures and bending fixtures.
These are essential components for the universal testing machines we discussed in this recent article.
These are clamp-like devices that hold samples in place during testing and include 3-point and 4-point bend fixtures and various types of wedge grips, some of which are designed to withstand very high temperatures and be used in environmental chambers for certain climatic tests.
Another point of contact between testing fixtures and climatic tests concerns electronics and specifically burn-in tests.
The burn-in test is a phase in the testing of an electronic board. It involves short-circuiting all the components on the board through climatic stress. The test temperature must be carefully controlled so as not to be too high and burn the chips, but high enough to simulate specific conditions.
We have covered this in detail in this article.
To best perform this type of test, the electronic board must be placed on special fixings, i.e. testing fixtures, capable of withstanding high temperatures and which support the board in the correct way.
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To perform extreme climate tests on electronic boards, an environmental chamber is required.
The FDM environmental chamber has a temperature range from -70°C to +180°C and can be equipped with testing fixtures of various sizes to perform a wide range of climatic tests on products and materials.
Thanks to the innovative controller stillFace, using an FDM environmental camera is simple and intuitive, also guaranteeing the reliability of the results.
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A testing fixture is a custom test bench that mechanically and electrically interfaces the Device Under Test (DUT) with the measurement equipment. Main types: (1) Bed-of-Nails with spring-loaded probe (test pitch 0.8-2.54 mm, current 0.5-3 A/pin, tip diameter 0.5-1.8 mm) for in-circuit PCB testing; (2) Double-sided clamshell for BGA/complex boards testing; (3) Edge-connector fixture for module testing with finger contacts; (4) Thermal chamber fixtures designed to operate in -55/+150 °C climatic chambers with Torlon, PEEK, Vespel materials; (5) RF/microwave fixtures with waveguides calibrated for DUT up to 40 GHz; (6) Burn-in socket for prolonged reliability stress (ZIF, LGA, BGA). Custom design requires 4-12 weeks of development with metrological validation.
Climatic chamber fixtures (-55 to +150°C typical) require: thermally stable materials (PEEK Tg 143°C, Torlon 4203 Tg 275°C, Vespel SP-1 continuous duty 300°C); Au-plated hard gold probes (contact resistance < 20 mΩ, mechanical cycles > 10⁶); hermetically sealed cable glands to prevent moisture ingress (IP65 rating typical); differential CTE compensation between fixture and PCB (Al CTE 23 ppm/K, G10 FR-4 14-17 ppm/K, invar 1.2 ppm/K) with stress-absorbing mechanical flotations; thermal mass limitation to reduce equilibration time (< 20 min for 1 kg fixture). Electrical connections use PTFE (-200/+260 °C service) or silicone (-60/+180 °C) wires with a diameter of 24-30 AWG for signals and 18-22 AWG for power supplies ≥ 1 A.
Critical tolerances include: probe positioning ± 0.05 mm relative to the CAD grid; contact surface flatness ≤ 0.025 mm across the entire fixture area (avoids differential contact); probe compression within ± 10% of the nominal force (typical 85-150 g for standard probes); DUT registration on centering guides with a tolerance of ± 0.1 mm. Dimensional verification on a CMM (Coordinate Measuring Machine) accuracy class U₁ ≤ 1.5 + L/400 μm according to ISO 10360-2. For RF/microwave applications, the tolerance drops to ± 10 μm with the use of precision-machined flanges and CTE control on the entire chain (fixture + DUT + probe). Post-production rework includes final lapping and alignment pins in h6 ground steel.
The qualification includes: (1) continuity test with 4-wire Kelvin tester, R < 100 mΩ; (2) insulation verification between adjacent probes R > 100 MΩ at 100 VDC according to IPC-TM-650 Method 2.5.17; (3) electrical mapping with cross-talk < -40 dB at 1 MHz for digital fixtures, -60 dB at 100 MHz for analog; (4) ESD verification for ESD-safe fixtures (surface resistance 10⁶-10⁹ Ω/□, discharge time < 2 s according to IEC 61340-5-1); (5) cycle life test with 100,000 mechanical actuations and degradation verification (contact degradation < 5%); (6) thermal qualification for climatic fixtures with -55/+125 °C cycle 500 cycles (MIL-STD-883 Method 1010 Condition B). The documentation includes PFMEA with Severity-Occurrence-Detection rating ≤ 100 for each critical probe.
Do you need to pass a regulatory test or are you looking for a chamber designed to your test protocol? Tell us your needs: the FDM technical team will respond to you, without intermediaries.